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Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. This thematic volume is on the topic of "Field-emission Source Mechanisms" and is authored by Kevin Jensen, Naval Research Laboratory, Washington, DC.
This special volume of Advances in Imaging and Electron Physics details the current theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. Edited by Dr. Ted Cremer, these volumes attempt to provide rapid assimilation of the presented topics that include neutron and x-ray scatter, refraction, diffraction, and reflection and their potential application. Key features: * Contributions from leading authorities * Informs and updates on all the latest developments in the field
Digital technology now enables unparalleled functionality and flexibility in the capture, processing, exchange, and output of color images. But harnessing its potential requires knowledge of color science, systems, processing algorithms, and device characteristics-topics drawn from a broad range of disciplines. One can acquire the requisite background with an armload of physics, chemistry, engineering, computer science, and mathematics books and journals- or one can find it here, in the Digital Color Imaging Handbook. Unprecedented in scope, this handbook presents, in a single concise and authoritative publication, the elements of these diverse areas relevant to digital color imaging. The first three chapters cover the basics of color vision, perception, and physics that underpin digital color imaging. The remainder of the text presents the technology of color imaging with chapters on color management, device color characterization, digital halftoning, image compression, color quantization, gamut mapping, computationally efficient transform algorithms, and color image processing for digital cameras. Each chapter is written by world-class experts and largely self-contained, but cross references between chapters reflect the topics' important interrelations. Supplemental materials are available for download from the CRC Web site, including electronic versions of some of the images presented in the book.
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. * Contributions from leading international scholars and industry experts * Discusses hot topic areas and presents current and future research trends * Invaluable reference and guide for physicists, engineers and mathematicians
Advances in Electronics and Electron Physics

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